Title:
ELECTRONIC COMPONENT TEST EQUIPMENT AND METHOD FOR CONVEYING TRAY
Document Type and Number:
WIPO Patent Application WO/2008/062522
Kind Code:
A1
Abstract:
An electronic component test equipment (1) comprises a test section (120) for allowing
an IC device to electrically touch a socket (52) provided in a high fix (51) attached
to the upper portion of a test head (5) with the IC device mounted on a test tray (TST)
in order to test the IC device. The test section (120) has a conveyor (124) for
conveying the test tray (TST) in the horizontal direction, and a height adjuster
(125) for varying the height of the conveyor (124) relative to the high fix (51).
Inventors:
ITO, Akihiko (32-1 Asahicho 1-chomeNerima-k, Tokyo 71, 1790071, JP)
伊藤 明彦 (〒71 東京都練馬区旭町一丁目３２番１号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
伊藤 明彦 (〒71 東京都練馬区旭町一丁目３２番１号 株式会社アドバンテスト内 Tokyo, 1790071, JP)
Application Number:
JP2006/323337
Publication Date:
May 29, 2008
Filing Date:
November 22, 2006
Export Citation:
Assignee:
ADVANTEST Corporation (32-1, Asahicho 1-chome Nerima-k, Tokyo 71, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町一丁目３２番１号 Tokyo, 1790071, JP)
ITO, Akihiko (32-1 Asahicho 1-chomeNerima-k, Tokyo 71, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町一丁目３２番１号 Tokyo, 1790071, JP)
ITO, Akihiko (32-1 Asahicho 1-chomeNerima-k, Tokyo 71, 1790071, JP)
International Classes:
G01R31/26; G01R31/26
Attorney, Agent or Firm:
TOKOSHIE PATENT FIRM (Nishishinjyuku KF Bldg. 70414-24, Nishishinjyuku8-chomeShinjyuku-ku, Tokyo23, Tokyo1600023, JP)
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