Title:
ELECTRONIC COMPONENT TEST EQUIPMENT AND METHOD FOR CONVEYING TRAY
Document Type and Number:
WIPO Patent Application WO/2008/062522
Kind Code:
A1
Abstract:
An electronic component test equipment (1) comprises a test section (120) for allowing
an IC device to electrically touch a socket (52) provided in a high fix (51) attached
to the upper portion of a test head (5) with the IC device mounted on a test tray (TST)
in order to test the IC device. The test section (120) has a conveyor (124) for
conveying the test tray (TST) in the horizontal direction, and a height adjuster
(125) for varying the height of the conveyor (124) relative to the high fix (51).
Inventors:
ITO AKIHIKO (JP)
MASUO YOSHIYUKI (JP)
MASUO YOSHIYUKI (JP)
Application Number:
PCT/JP2006/323337
Publication Date:
May 29, 2008
Filing Date:
November 22, 2006
Export Citation:
Assignee:
ADVANTEST CORP (JP)
ITO AKIHIKO (JP)
MASUO YOSHIYUKI (JP)
ITO AKIHIKO (JP)
MASUO YOSHIYUKI (JP)
International Classes:
G01R31/26
Domestic Patent References:
| WO2004011952A1 | 2004-02-05 |
Foreign References:
| JP2006030151A | 2006-02-02 | |||
| JPH1183943A | 1999-03-26 |
Attorney, Agent or Firm:
TOKOSHIE PATENT FIRM (Nishishinjyuku8-chomeShinjyuku-ku, Tokyo23, JP)
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