ELECTRONIC COMPONENT TEST HANDLER

Title:

ELECTRONIC COMPONENT TEST HANDLER

Document Type and Number:

WIPO Patent Application WO/2020/213960

Kind Code:

A1

Abstract:

An electronic component test handler according to an embodiment of the present invention comprises: a push plate having at least one first through-hole formed therein through which a test gas is supplied; a support block which is elastically supported on one surface of the push plate and has a second through-hole formed therein that corresponds to the first through-hole; and a matching block which is supported on the support block so as to be minutely movable, and has a discharge flow path formed therein that is provided corresponding to the second through-hole to allow the test gas to be discharged to the outside.

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Inventors:

LEE TAEK SEON (KR)
YEO DONG HYUN (KR)
RYU IL HA (KR)

Application Number:

PCT/KR2020/005112

Publication Date:

October 22, 2020

Filing Date:

April 16, 2020

Export Citation:

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Assignee:

ATECO INC (KR)

International Classes:

G01R31/28; H01L21/67; H01L21/68

Foreign References:

KR20150014357A	2015-02-06
KR20100124544A	2010-11-29
KR101086934B1	2011-11-29
KR20080002841U	2008-07-25
KR101272630B1	2013-06-10

Attorney, Agent or Firm:

ENVISION PATENT & LAW FIRM (KR)

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