Title:
ELECTRONIC CONTROL SYSTEM AND ELECTRONIC CONTROL DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/224535
Kind Code:
A1
Abstract:
This electronic control system comprises: a first measurement unit that measures current; a second measurement unit that measures temperature; a third measurement unit that measures current or temperature; power semiconductor elements that control power supply to a load; and an electronic control device that controls the operations of the power semiconductor elements using the measurement results by the first measurement unit, the second measurement unit, and the third measurement unit. At least some of the power semiconductor elements embed the first measurement unit and the second measurement unit. The electronic control device estimates temperature from the measured value of the current, determines, on the basis of the measured value of the first measurement unit, the measured value of the second measurement unit, and the measured value of the third measurement unit, whether the first measurement unit, the second measurement unit, and the third measurement unit are normal or abnormal, and detects, according to the measurement results of the measurement units determined to be normal, an abnormality of at least either the power semiconductor elements or a wire harness through which the output currents of the power semiconductor elements flow.
Inventors:
KANEKAWA NOBUYASU (JP)
FUKUDA TAKAO (JP)
NAKANO HIROSHI (JP)
FUKUDA TAKAO (JP)
NAKANO HIROSHI (JP)
Application Number:
PCT/JP2022/004040
Publication Date:
October 27, 2022
Filing Date:
February 02, 2022
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
H02H5/04; H02H7/00; H02H6/00; H02J7/00
Foreign References:
| JPH05260644A | 1993-10-08 | |||
| JP2016082641A | 2016-05-16 | |||
| JP2012075234A | 2012-04-12 |
Attorney, Agent or Firm:
TOU-OU PATENT FIRM (JP)
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