Title:
ELECTRONIC DEVICE FOR DETECTING DEFECT OF SEMICONDUCTOR COMPONENT, AND METHOD FOR CONTROLLING SAME
Document Type and Number:
WIPO Patent Application WO/2022/255621
Kind Code:
A1
Abstract:
According to one embodiment, an electronic device comprises a DC supply, an RF power supply, and at least one processor operatively connected to the DC supply and the RF power supply. The at least one processor may: determine a current level, between a maximum current at which a semiconductor component can operate and an absolute maximum rating (AMR) current, or an RF power level between a maximum RF power at which the semiconductor component can operate and an absolute maximum rating (AMR) RF power; and, if a current level is determined, control the DC supply to apply a current of the determined current level to the semiconductor component, or if an RF power level is determined, control the RF power supply to apply an RF power of the determined RF power level to the semiconductor component.
Inventors:
LEE KYEONGGEUN (KR)
CHOI WOOSUNG (KR)
CHOI WOOSUNG (KR)
Application Number:
PCT/KR2022/004908
Publication Date:
December 08, 2022
Filing Date:
April 06, 2022
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G01R31/28; G01R19/165; G01R23/00
Foreign References:
| JP2002354664A | 2002-12-06 | |||
| US20190228279A1 | 2019-07-25 | |||
| JPH11122805A | 1999-04-30 | |||
| JP2008294334A | 2008-12-04 | |||
| JP2013231724A | 2013-11-14 |
Attorney, Agent or Firm:
LEE, Keon-Joo et al. (KR)
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