Title:
ELECTRONIC DEVICE AND STRESS MEASUREMENT METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2019/039716
Kind Code:
A1
Abstract:
Various embodiments of the present invention relate to an electronic device and a stress measurement method thereof. The electronic device comprises: a memory for storing a first histogram for determining reference information for computing health condition of a user; a biometric sensor; and at least one processor functionally connected to the memory and the biometric sensor, wherein the at least one processor may be configured to acquire biometric information via the biometric sensor, generate a second histogram by analyzing the acquired biometric information, accumulate the second histogram in the first histogram, thereby updating the first histogram, and update the reference information on the basis of the updated first histogram. Other various embodiments are possible.
Inventors:
LEE DONGHYUN (KR)
SHIN SEUNGHWAN (KR)
OH JUNSEOK (KR)
CHOI JONGMIN (KR)
SEO JINWOO (KR)
LEE SEUNG-EUN (KR)
SHIN SEUNGHWAN (KR)
OH JUNSEOK (KR)
CHOI JONGMIN (KR)
SEO JINWOO (KR)
LEE SEUNG-EUN (KR)
Application Number:
PCT/KR2018/007011
Publication Date:
February 28, 2019
Filing Date:
June 21, 2018
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
A61B5/00; A61B5/024
Domestic Patent References:
| WO2016021361A1 | 2016-02-11 |
Foreign References:
| JP2016110207A | 2016-06-20 | |||
| JP2016202222A | 2016-12-08 | |||
| KR20170061263A | 2017-06-05 | |||
| JP2002149830A | 2002-05-24 |
Attorney, Agent or Firm:
KWON, Hyuk-Rok et al. (KR)
Download PDF: