Title:
ELECTROOPTICAL EFFECT ELEMENT AND DEVICE FOR MEASURING ELECTRIC SIGNAL WAVEFORMS USING SAID ELEMENT
Document Type and Number:
WIPO Patent Application WO/1989/012831
Kind Code:
A1
Abstract:
The electrooptical effect element of the invention has first, second and third electrodes. Among them, the first and second electrodes are provided to constitute microstrip lines in a substrate that has electrooptical effects like the conventional one, in order to form an r-f electric field which polarizes the light. The third electrode is provided on the substrate being separated away from said second electrode in order to form another electric field for cancelling the polarization of light caused by the above-mentioned r-f electric field. In the device for measuring electric signal waveforms of the invention, the electric signals obtained from the light detections system coupled to the electrooptical effect element are fed back to the third electrode in order to form a closed loop.
Inventors:
KAWANO YOUZO (JP)
TAKAHASHI TADASHI (JP)
SHIMURA YASUHIKO (JP)
TAKAHASHI YUKIHIRO (JP)
TAKAHASHI TADASHI (JP)
SHIMURA YASUHIKO (JP)
TAKAHASHI YUKIHIRO (JP)
Application Number:
PCT/JP1988/001071
Publication Date:
December 28, 1989
Filing Date:
October 21, 1988
Export Citation:
Assignee:
ANRITSU CORP (JP)
International Classes:
G01R13/34; G01R15/24; (IPC1-7): G01R15/07
Foreign References:
| JPS60253878A | 1985-12-14 | |||
| JPS62150173A | 1987-07-04 | |||
| JPS59160770A | 1984-09-11 | |||
| JPS58216963A | 1983-12-16 |
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