Title:
ELECTROTHERMAL CHARACTERIZATION OF MICRO-SCALE AND NANO-SCALE SAMPLES AND RELATED SYSTEMS
Document Type and Number:
WIPO Patent Application WO/2023/213207
Kind Code:
A1
Abstract:
A method for electrothermal characterization of small (e.g., micro-scale or nano-scale) samples is provided. The method involve causing a temperature variation inside a sample, and determining a transient signal response (e.g., a voltage rise or drop) arising in the sample as a result of the temperature variation. The temperature variation may be caused by allowing amplitude modulated electric current (e.g., stepped current or periodic stepped current) to flow through the sample. The temperature variation may be caused by controlling a laser source to irradiate the sample. Thermal characteristics of the sample (e.g., thermal diffusivity, thermal conductivity, specific heat) can be determined based on the transient response. The method can be executed by a computer system in an automatic fashion.
Inventors:
LIU GUOQING (US)
PLOSS RICHARD S (US)
WANG XINWEI (US)
PLOSS RICHARD S (US)
WANG XINWEI (US)
Application Number:
PCT/CN2023/090377
Publication Date:
November 09, 2023
Filing Date:
April 24, 2023
Export Citation:
Assignee:
LIU GUOQING (US)
ACS THERMAL LLC (US)
ACS THERMAL LLC (US)
International Classes:
G01N25/20
Foreign References:
| CN101788513A | 2010-07-28 | |||
| CN102053171A | 2011-05-11 | |||
| CN103940845A | 2014-07-23 | |||
| CN206489103U | 2017-09-12 | |||
| US20170059498A1 | 2017-03-02 |
Attorney, Agent or Firm:
GEXU INTELLECTUAL PROPERTY LAW FIRM (CN)
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