Title:
ELEMENT ANALYSIS DEVICE, MOUNTING JIG, AND MOUNTING METHOD
Document Type and Number:
WIPO Patent Application WO/2022/054919
Kind Code:
A1
Abstract:
In order to provide an element analysis device capable of exchanging only a part of a worn electrode tip for an electrode having a housing recess in which a crucible is housed during elemental analysis, an element analysis device 100 sandwiches a crucible MP containing a sample between a first electrode 31 and a second electrode 32 and heats the sample by passing an electric current between the first electrode 31 and the second electrode 32, wherein the first electrode 31 includes a first electrode main body 31B in which an accommodation recess 311 for accommodating the crucible MP is formed, and a first electrode tip 31C detachably provided with respect to the first electrode main body 31B in the accommodation recess 311 such that a part of the first electrode tip 31C is exposed.
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Inventors:
INOUE TAKAHITO (JP)
UCHIHARA HIROSHI (JP)
HIRATA YASUSHI (JP)
UCHIHARA HIROSHI (JP)
HIRATA YASUSHI (JP)
Application Number:
PCT/JP2021/033379
Publication Date:
March 17, 2022
Filing Date:
September 10, 2021
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01N31/00; G01N1/22; G01N31/12
Foreign References:
| JPS54103282U | 1979-07-20 | |||
| JP2009053119A | 2009-03-12 | |||
| JPS58153087A | 1983-09-10 | |||
| JPS52128194A | 1977-10-27 | |||
| US3936587A | 1976-02-03 |
Attorney, Agent or Firm:
NISHIMURA, Ryuhei (JP)
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