Title:
ELEMENTAL ANALYSIS DEVICE, PROGRAM FOR ELEMENTAL ANALYSIS DEVICE, AND ELEMENTAL ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2020/137147
Kind Code:
A1
Abstract:
An elemental analysis device 100 analyzes gas produced through the heating of a sample accommodated in a graphite crucible and is capable of enhancing analysis accuracy through baseline correction using a baseline that simulates signal intensity change over time caused by gas produced from the graphite crucible. The elemental analysis device 100 comprises a signal intensity reception unit 11 for receiving a signal intensity obtained by a gas detector and a baseline correction unit 12 for subjecting a spectrum S indicating the change over time in the signal intensity to baseline correction using a correction function having, as parameters, a starting point intensity that is the signal intensity at a rising start point A of a peak of the spectrum S and an ending point intensity that is the signal intensity at a falling end point B of the peak. The correction function is made to converge at the starting point intensity and ending point intensity and have a part X between the rising start point A and falling end point B that has a slope different from the slope of a straight line Z joining the rising start point A and falling end point B.
Inventors:
HIRANO AKIHIRO (JP)
NAKAMURA TATSUHITO (JP)
NAKAMURA TATSUHITO (JP)
Application Number:
PCT/JP2019/042786
Publication Date:
July 02, 2020
Filing Date:
October 31, 2019
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01N31/00; G01N31/12
Domestic Patent References:
| WO2012093482A1 | 2012-07-12 |
Foreign References:
| JP2013250061A | 2013-12-12 | |||
| JPS639861A | 1988-01-16 | |||
| JP2745122B2 | 1998-04-28 | |||
| JPH07103900A | 1995-04-21 | |||
| JPH0645883Y2 | 1994-11-24 | |||
| JP2007121319A | 2007-05-17 | |||
| JPH076969B2 | 1995-01-30 | |||
| JP2012127806A | 2012-07-05 | |||
| JP2000275233A | 2000-10-06 | |||
| US4409336A | 1983-10-11 |
Attorney, Agent or Firm:
NISHIMURA, Ryuhei (JP)
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