Title:
EQUIPMENT DIAGNOSIS SYSTEM AND EQUIPMENT DIAGNOSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2023/224044
Kind Code:
A1
Abstract:
This equipment diagnosis system for identifying an abnormality cause candidate on the basis of a state quantity of equipment comprises: an input device for receiving a state quantity; a diagnosis device for identifying, on the basis of the state quantity received by the input device and a prescribed diagnosis rule, an abnormality cause candidate and a physical phenomenon and an engineering factor relating to the abnormality cause candidate; and an output device for outputting the abnormality cause candidate, the physical phenomenon, and the engineering factor, as diagnosis results.
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Inventors:
TAMURA KOICHI (JP)
FUJII TAKASHI (JP)
FUJII TAKASHI (JP)
Application Number:
PCT/JP2023/018289
Publication Date:
November 23, 2023
Filing Date:
May 16, 2023
Export Citation:
Assignee:
IHI POWER SYSTEMS CO LTD (JP)
MITSUI E&S DU CO LTD (JP)
MITSUI E&S DU CO LTD (JP)
International Classes:
G01M99/00; F02D45/00; G05B23/02
Foreign References:
| JPH0674876A | 1994-03-18 | |||
| JP2003150237A | 2003-05-23 | |||
| JPH0572026A | 1993-03-23 | |||
| JP2021039491A | 2021-03-11 | |||
| JPH08240479A | 1996-09-17 | |||
| CN111122199A | 2020-05-08 |
Attorney, Agent or Firm:
NISHIZAWA Kazuyoshi et al. (JP)
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