Title:
ERROR DETECTION METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2010/041355
Kind Code:
A1
Abstract:
Provided are a method which permits complete training data and data with added errors, and enables the early and accurate discovery of errors in facilities such as a plant, and a system thereof. To achieve the objectives, (1) the behavior of temporal data is observed over time, and the trace is divided into clusters; (2) the divided cluster groups are modeled in partial spaces, and the offset values are calculated as error candidates; (3) the training data are used (compare, reference, etc.) for reference to determine the state transitions caused by the changes over time, the environmental changes, the maintenance (parts replacement), and the operation states; and (4) the modeling is a partial space method such as regression analysis or projection distance method of every N data removing N data items (N = 0, 1, 2,…) (for example, when N = 1, one error data item is considered to have been added, this data is removed, then the modeling is performed), or a local partial space method. Linear fitting in regression analysis is equivalent to the lowest order regression analysis.
Inventors:
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
SHIBUYA HISAE (JP)
Application Number:
PCT/JP2009/002391
Publication Date:
April 15, 2010
Filing Date:
May 29, 2009
Export Citation:
Assignee:
HITACHI LTD (JP)
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
International Classes:
G05B23/02; G06Q50/00; G06Q50/10
Foreign References:
| JP2006252259A | 2006-09-21 | |||
| JP2006107179A | 2006-04-20 | |||
| JP2007198918A | 2007-08-09 | |||
| JP2000184593A | 2000-06-30 | |||
| JPH0728766A | 1995-01-31 | |||
| US6952662B2 | 2005-10-04 | |||
| US6975962B2 | 2005-12-13 | |||
| US6216066B1 | 2001-04-10 |
Other References:
STEPHAN W.: "Wegerich; Nonparametric modeling of vibration signal features for equipment health monitoring, Aerospace Conference", PROCEEDINGS. 2003 IEEE, vol. 7, 2003, pages 3113 - 3121
S. SHIN: "Wavelet Kaiseki no Sangyo Oyo (Industry Application of Wavelet Analysis)", 2005, ASAKURA PUBLISHING CO,. LTD.
See also references of EP 2333629A4
S. SHIN: "Wavelet Kaiseki no Sangyo Oyo (Industry Application of Wavelet Analysis)", 2005, ASAKURA PUBLISHING CO,. LTD.
See also references of EP 2333629A4
Attorney, Agent or Firm:
POLAIRE I. P. C. (JP)
Polaire Intellectual Property Corporation (JP)
Polaire Intellectual Property Corporation (JP)
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