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Patent Searching and Data


Title:
ESD TESTING DEVICE, INTEGRATED CIRCUIT, AND METHOD APPLICABLE IN DIGITAL INTEGRATED CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2018/010084
Kind Code:
A1
Abstract:
An ESD detecting device, integrated circuit, and method applicable in a digital integrated circuit. The device of the present application comprises: check reading control module, configured as to launch a read operation with respect to a trigger collection module; a check operation module, configured as to receive a trigger value transmitted by the trigger collection module on the basis of the read operation, to perform a check calculation on the basis of the trigger value, and to determine, on the basis of a comparison between the check calculation result and a past check calculation result, whether an ESD overrun is present. The present application employs a simple circuit structure for detecting an ESD overrun, and obviates the need to take up resources of an external master controller, thus preventing other operations from being affected, increasing efficiency, and allowing the real-time discovery of an ESD overrun.

Inventors:
WANG GUANGYAO (CN)
Application Number:
CN2016/089755
Publication Date:
January 18, 2018
Filing Date:
July 12, 2016
Export Citation:
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Assignee:
SHENZHEN GOODIX TECH CO LTD (518000, CN)
International Classes:
H02H9/00
Foreign References:
CN102368171A2012-03-07
CN101610080A2009-12-23
CN105281312A2016-01-27
US8730624B22014-05-20
Other References:
See also references of EP 3288136A4
None
Attorney, Agent or Firm:
BEIJING HEADSTAY INTELLECTUAL PROPERTY INC. (LI Jie, 5A1-2 Huajie Plaza,Building No. 1, Dazhongsi No. 13, Haidian District, Beijing 8, 100098, CN)
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