Title:
ESTIMATION DEVICE AND ESTIMATION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/189107
Kind Code:
A1
Abstract:
This estimation device comprises an acquisition unit, a testing unit, a generation unit, and an estimating unit. The acquisition unit acquires a feature quantity obtained from a target in a first state of the target, and a feature quantity in a second state of the target different from the first state. The testing unit tests a significant difference between the acquired feature quantity in the first state and the acquired feature quantity in the second state. The generation unit generates a contribution degree of the feature quantity to the state change between the first state and the second state of the target, from the tested significant difference. The estimating unit quantitatively estimates a factor of state change between the first state and the second state of the target on the basis of the generated contribution degree.
Inventors:
TSUKUDA KOKI (JP)
Application Number:
PCT/JP2023/007264
Publication Date:
October 05, 2023
Filing Date:
February 28, 2023
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01M99/00; B23Q17/09; G01M13/00
Foreign References:
| JP6851558B1 | 2021-03-31 | |||
| JP2019128704A | 2019-08-01 | |||
| JP2015172945A | 2015-10-01 | |||
| JP2012189319A | 2012-10-04 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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