Title:
ETCHING SOLUTION FOR MULTILAYER THIN FILM HAVING COPPER LAYER AND MOLYBDENUM LAYER CONTAINED THEREIN
Document Type and Number:
WIPO Patent Application WO/2011/099624
Kind Code:
A1
Abstract:
Disclosed are: an etching solution for a multilayer thin film having a copper layer and a molybdenum layer contained therein; and a method for etching a multilayer thin film having a copper layer and a molybdenum layer contained therein using the etching solution.
Specifically disclosed are: an etching solution for a multilayer thin film having a copper layer and a molybdenum layer contained therein, which comprises (A) hydrogen peroxide, (B) an inorganic acid having no fluorine atom, (C) an organic acid, (D) an amine compound having 2 to 10 carbon atoms and also having an amino group and a hydroxy group in the total number of two or more, (E) an azole, and (F) a hydrogen peroxide stabilizer, and which has a pH value of 2.5 to 5; and an etching method using the etching solution.
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Inventors:
OKABE SATOSHI (JP)
NARITA KAZUYO (JP)
MATSUBARA MASAHIDE (JP)
ADANIYA TOMOYUKI (JP)
MARUYAMA TAKETO (JP)
NARITA KAZUYO (JP)
MATSUBARA MASAHIDE (JP)
ADANIYA TOMOYUKI (JP)
MARUYAMA TAKETO (JP)
Application Number:
PCT/JP2011/053151
Publication Date:
August 18, 2011
Filing Date:
February 15, 2011
Export Citation:
Assignee:
MITSUBISHI GAS CHEMICAL CO (JP)
OKABE SATOSHI (JP)
NARITA KAZUYO (JP)
MATSUBARA MASAHIDE (JP)
ADANIYA TOMOYUKI (JP)
MARUYAMA TAKETO (JP)
OKABE SATOSHI (JP)
NARITA KAZUYO (JP)
MATSUBARA MASAHIDE (JP)
ADANIYA TOMOYUKI (JP)
MARUYAMA TAKETO (JP)
International Classes:
C23F1/18; C23F1/30; H01L21/308; H01L21/3205; H01L21/3213; H01L23/52
Foreign References:
JP2002060980A | 2002-02-28 | |||
JP2002302780A | 2002-10-18 | |||
JP2009076601A | 2009-04-09 | |||
JP2006111953A | 2006-04-27 | |||
JPH01292890A | 1989-11-27 | |||
JP4282927B2 | 2009-06-24 | |||
JP2004193620A | 2004-07-08 |
Other References:
See also references of EP 2537960A4
Attorney, Agent or Firm:
OHTANI, Tamotsu et al. (JP)
Tamotsu Otani (JP)
Tamotsu Otani (JP)
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Claims: