Title:
EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COMPOSITE EVALUATION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2018/155216
Kind Code:
A1
Abstract:
The present invention simply evaluates radiation noise of a semiconductor device and estimates the radiation noise of an apparatus to which the semiconductor device is mounted. Provided are an evaluation method and an evaluation apparatus, the evaluation method comprising: a step for causing a semiconductor device to perform switching operations; a step for measuring the change of voltage which is caused between main terminals of the semiconductor device during the switching operations; and a step for outputting an evaluation index for the radiation noise of the semiconductor device on the basis of the change of voltage. In the step for outputting an evaluation index, the change of voltage in the semiconductor device may be calculated for every frequency component as the evaluation index.
Inventors:
KATSUMATA HIROKI (JP)
TAMATE MICHIO (JP)
FUJITA MIWAKO (JP)
ASANO TAMIKO (JP)
SUZUKI YUHEI (JP)
KAIMI TAKASHI (JP)
SUNASAKA YUTA (JP)
YAMADA TADANORI (JP)
ARAKI RYU (JP)
HIU BAOCONG (JP)
TAMATE MICHIO (JP)
FUJITA MIWAKO (JP)
ASANO TAMIKO (JP)
SUZUKI YUHEI (JP)
KAIMI TAKASHI (JP)
SUNASAKA YUTA (JP)
YAMADA TADANORI (JP)
ARAKI RYU (JP)
HIU BAOCONG (JP)
Application Number:
PCT/JP2018/004486
Publication Date:
August 30, 2018
Filing Date:
February 08, 2018
Export Citation:
Assignee:
FUJI ELECTRIC CO LTD (JP)
International Classes:
G01R31/26; G01R29/08
Domestic Patent References:
| WO2014174854A1 | 2014-10-30 |
Foreign References:
| JP2011253434A | 2011-12-15 | |||
| JP2009290938A | 2009-12-10 | |||
| JP2000184695A | 2000-06-30 | |||
| JP2007221876A | 2007-08-30 |
Attorney, Agent or Firm:
RYUKA IP LAW FIRM (JP)
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