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Title:
EVALUATION SYSTEM, EVALUATION METHOD, AND EVALUATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/087526
Kind Code:
A1
Abstract:
A learning part 81 generates a plurality of sample groups from samples used in learning and generates a plurality of predictive models such that, from among the generated sample groups, the sample groups used in learning do not overlap. An optimization part 82 generates a target function on the basis of an explanatory variable predicted by the predictive models and an optimization constraint and optimizes the generated target function. An evaluation part 83 evaluates the result of the optimization using the sample groups not used in the learning of the predictive models used in generating the optimized target function.

Inventors:
ITO Shinji (7-1 Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
FUJIMAKI Ryohei (7-1 Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
Application Number:
JP2018/030543
Publication Date:
May 09, 2019
Filing Date:
August 17, 2018
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Assignee:
NEC CORPORATION (7-1 Shiba 5-chome, Minato-ku Tokyo, 01, 〒1088001, JP)
International Classes:
G06N99/00
Domestic Patent References:
WO2017094207A12017-06-08
Foreign References:
JP2012172143A2012-09-10
JP2017530435A2017-10-12
Attorney, Agent or Firm:
IWAKABE Fuyuki et al. (SUNRISE PATENT OFFICE, Yomiuriyaesu Bldg. 6F 8-7, Kyobashi 2-chome, Chuo-k, Tokyo 31, 〒1040031, JP)
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