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Patent Searching and Data


Title:
EVALUATION SYSTEM AND EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/216167
Kind Code:
A1
Abstract:
This evaluation system for evaluating the vertical height of each of a plurality of module installation surfaces in a frame having the plurality of module installation surfaces to which a plurality of solar cell modules are attached comprises: a height measuring device including a laser emission unit, which is installed on a reference surface of the frame and emits a laser, and measuring units installed on the module installation surfaces; and a data processing unit for processing measurement results from the height measuring device. The measuring units include: a light receiving unit that receives the laser emitted from the laser emission unit; and a calculation unit that detects the vertical height of the module installation surfaces on the basis of the position at which the laser is received in the light receiving unit. The data processing device outputs, for each of the plurality of module installation surfaces, height adjustment values for each of the light receiving surfaces of the plurality of solar cell modules to form one surface, the height adjustment values being output on the basis of the respective differences between the vertical heights of the plurality of module installation surfaces detected by the calculation unit and a predetermined reference vertical height.

Inventors:
KONAKA HIROYUKI (JP)
MORI KOJI (JP)
KOBAYASHI MASATAKA (JP)
YAMAMOTO SEIJI (JP)
UMEHARA TAKESHI (JP)
Application Number:
PCT/JP2019/016935
Publication Date:
November 14, 2019
Filing Date:
April 22, 2019
Export Citation:
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Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
G01B11/30; G01C15/00; H02S20/00
Foreign References:
JP2010242367A2010-10-28
JP2001151500A2001-06-05
JP2009204349A2009-09-10
JPH11166831A1999-06-22
JP2014070468A2014-04-21
JP2013170353A2013-09-02
US20170302221A12017-10-19
JP2018090088A2018-06-14
JP2017022838A2017-01-26
Other References:
See also references of EP 3792589A4
Attorney, Agent or Firm:
SUNCREST PATENT AND TRADEMARK ATTORNEYS (JP)
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