Title:
EXAMINATION DEVICE, EXAMINATION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/034167
Kind Code:
A1
Abstract:
The present disclosure includes an imaging sensor, an imaging method, and a non-transitory computer-readable medium. The imaging sensor includes a plurality of wavelength detection regions. The plurality of wavelength detection regions including at least a first wavelength detection region. The first wavelength detection region comprises a plurality of pixels configured to detect light within a first pre-determined wavelength range, and detect the light at different pre-determined polarization directions.
Inventors:
MITANI HITOSHI (JP)
WAKAZONO MASAFUMI (JP)
WAKAZONO MASAFUMI (JP)
Application Number:
PCT/JP2017/028290
Publication Date:
February 22, 2018
Filing Date:
August 03, 2017
Export Citation:
Assignee:
SONY CORP (JP)
International Classes:
H04N9/04; G02B5/30; H04N5/232; H04N5/225
Foreign References:
| EP2252069A2 | 2010-11-17 | |||
| US20130070140A1 | 2013-03-21 | |||
| US20160006954A1 | 2016-01-07 | |||
| US20150206912A1 | 2015-07-23 | |||
| JPS4932978B1 | 1974-09-04 |
Other References:
XING-FEI HE: "Focus on Polarization", PHOTONICS SPECTRA, 1 July 2016 (2016-07-01), pages 1 - 4, XP055444872, Retrieved from the Internet [retrieved on 20180126]
Attorney, Agent or Firm:
NISHIKAWA Takashi et al. (JP)
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