Title:
EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/079543
Kind Code:
A1
Abstract:
The present invention aims to shorten the time required for external appearance inspections. This external appearance inspection apparatus (1) inspects the external appearance of an inspection target object and comprises: an imaging unit (3) that captures an image of the inspection target object (30) arranged at a prescribed position on the appearance inspection apparatus; and height measurement units (11, 12) that measure the height of the target object (30) carried into or out of the external appearance inspection apparatus (1).
Inventors:
HAYASHI SHINGO (JP)
KONISHI DAISUKE (JP)
KONISHI DAISUKE (JP)
Application Number:
PCT/JP2020/010532
Publication Date:
April 29, 2021
Filing Date:
March 11, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01B11/02
Foreign References:
| JP2012190890A | 2012-10-04 | |||
| JP2017166865A | 2017-09-21 | |||
| JP2013156172A | 2013-08-15 |
Attorney, Agent or Firm:
IP FIRM SHUWA (JP)
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