Title:
EXTERNAL WORLD RECOGNITION DEVICE AND EXTERNAL WORLD RECOGNITION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/004325
Kind Code:
A1
Abstract:
This external world recognition device comprises: an imaging plane estimation unit that estimates an imaging plane in a first image, on the basis of a result obtained from sensing a landmark by a first landmark sensing unit: an image conversion estimation unit that estimates an image conversion parameter according to an imaging plane in a second image, on the basis of information on the imaging plane estimated by the imaging plane estimation unit and imaging parameters of a plurality of imaging units; a feature comparison unit that compares a landmark feature sensed in the first image on which image conversion is performed using the image conversion parameter estimated by the image conversion estimation unit, with a landmark feature sensed in the second image; and a position estimation unit that estimates the three-dimensional position of the landmark on the basis of a comparison result of the feature comparison unit.
Inventors:
KIDO HIDEAKI (JP)
IRIE KOTA (JP)
SAI HIROTOMO (JP)
IRIE KOTA (JP)
SAI HIROTOMO (JP)
Application Number:
PCT/JP2023/014887
Publication Date:
January 04, 2024
Filing Date:
April 12, 2023
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
G01C3/06; G01B11/00; G06T7/00; G06T7/593; G08G1/16; H04N7/18
Domestic Patent References:
| WO2020017334A1 | 2020-01-23 |
Foreign References:
| JP2016175586A | 2016-10-06 | |||
| JP2019095345A | 2019-06-20 |
Attorney, Agent or Firm:
SHIN-YU INTERNATIONAL PATENT FIRM (JP)
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