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Title:
FACILITY STATE ANALYZING DEVICE, FACILITY STATE ANALYZING METHOD, AND RECORDING MEDIUM STORING FACILITY STATE ANALYZING PROGRAM THEREON
Document Type and Number:
WIPO Patent Application WO/2019/160043
Kind Code:
A1
Abstract:
A facility state analyzing device 40 comprises a measurement unit 41, an extraction unit 42, a measurement condition determination unit 43, and an analysis unit 44. The measurement unit 41 measures the load on a facility 50 and generates load information 410 indicating the measured load on the basis of a measurement condition 430. The extraction unit 42 extracts, from the load information 410 generated by the measurement unit 41, dynamic load information 420, which indicates a dynamic component of the load whose degree of dynamic fluctuation with a lapse of time is higher than a reference. The measurement condition determination unit 43 determines, on the basis of temporal transition of the dynamic load information 420, a measurement condition 420 indicating a period of time during which the load information 410 is generated. The analysis unit 44 analyzes the load applied on the facility 50 by using the load information 410 generated on the basis of the measurement condition 430. With this configuration, the facility state analyzing device 40 efficiently increases accuracy in estimating the state of a facility on the basis of a situation of a load applied to the facility.

Inventors:
TAKAHASHI MASATAKE (JP)
TOMINAGA SHIN (JP)
Application Number:
PCT/JP2019/005360
Publication Date:
August 22, 2019
Filing Date:
February 14, 2019
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01M99/00; F17D5/00; G06Q10/00; G06Q50/06
Foreign References:
JPH1114782A1999-01-22
JP4371119B22009-11-25
JP2002310840A2002-10-23
EP2940447A12015-11-04
JP2012112787A2012-06-14
JP2007205860A2007-08-16
JP2014016691A2014-01-30
JP2018026173A2018-02-15
Other References:
See also references of EP 3754321A4
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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