FACILITY STATE MONITORING METHOD AND DEVICE FOR SAME

Title:

FACILITY STATE MONITORING METHOD AND DEVICE FOR SAME

Document Type and Number:

WIPO Patent Application WO/2013/030984

Kind Code:

A1

Abstract:

In case-based abnormality symptom detection in a facility requires comprehensive collection of diverse normal states, there are problems such as error generation due to insufficient learning data because the states will greatly differ depending upon the operation pattern such as length of stopping time, or the problem of execution difficulty due to increased memory capacity and calculation time when the learning data period has been increased until the learning data insufficiency is resolved. In order to solve such problems, there is provided a method for monitoring facility state on the basis of a time sequence signal outputted from the facility, wherein an operation pattern label for each fixed interval is assigned on the basis of the time sequence signal, learning data is selected on the basis of the operation pattern label for each fixed interval, a normal model is created on the basis of the selected learning data, an abnormality measurement is calculated on the basis of the time sequence signal and the normal model, and the facility state is determined to be abnormal or normal on the basis of the calculated abnormality measurement.

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Inventors:

SHIBUYA HISAE (JP)
MAEDA SHUNJI (JP)

Application Number:

PCT/JP2011/069791

Publication Date:

March 07, 2013

Filing Date:

August 31, 2011

Export Citation:

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Assignee:

HITACHI ENG SERVICE (JP)
SHIBUYA HISAE (JP)
MAEDA SHUNJI (JP)

International Classes:

G05B23/02; G06N20/00

Domestic Patent References:

WO2011024382A1

2011-03-03

Foreign References:

JP2011081697A

2011-04-21

Other References: