Title:
FACTOR ANALYSIS DEVICE, FACTOR ANALYSIS METHOD, AND FACTOR ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/004662
Kind Code:
A1
Abstract:
A factor analysis device according to one aspect of the present disclosure is provided with a model acquiring unit (108), a monitoring target data acquiring unit (101), a distance calculating unit (108), and a factor analyzing unit (110). The model acquiring unit acquires a normal model. The data acquiring unit acquires monitoring target data for each of a plurality of systems of an appliance. The distance calculating unit calculates the distance between the normal model and a value based on the monitoring target data, for each of the plurality of systems. The factor analyzing unit identifies a system that is an abnormality factor, from among the plurality of systems, on the basis of the calculated distances.
Inventors:
MORIBE ATSUSHI (JP)
Application Number:
PCT/JP2021/024369
Publication Date:
January 06, 2022
Filing Date:
June 28, 2021
Export Citation:
Assignee:
DENSO CORP (JP)
International Classes:
G05B23/02; F02D45/00
Domestic Patent References:
| WO2020162069A1 | 2020-08-13 |
Foreign References:
| JP2008215113A | 2008-09-18 | |||
| JP2020035407A | 2020-03-05 | |||
| JP2011141658A | 2011-07-21 | |||
| JP2007198918A | 2007-08-09 |
Attorney, Agent or Firm:
NAGOYA INTERNATIONAL PATENT FIRM (JP)
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