FAILURE DIAGNOSIS DEVICE AND FAILURE DIAGNOSIS METHOD

Title:

FAILURE DIAGNOSIS DEVICE AND FAILURE DIAGNOSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2017/104305

Kind Code:

A1

Abstract:

The failure diagnosis device is equipped with: a synchronized normal data group generation means (31) for generating a synchronized normal data group (22) by synchronizing multiple normal operation characteristics, which are detected over multiple times when a piece of equipment is in a normal state, with use of a synchronization means (5); a synchronized diagnosis data generation means (32) for generating synchronized diagnosis data (23) by synchronizing diagnostic operation characteristics, which are detected when the piece of equipment is in a diagnostic state, with the synchronized normal data group using the synchronization means (5); a Mahalanobis distance calculation means (7) for calculating, upon forming a unit space on the basis of the synchronized normal data group, a Mahalanobis distance of the synchronized diagnosis data within the unit space; and a comparison means (8) for comparing the Mahalanobis distance with a preset threshold value, thereby determining a failure of the piece of equipment when the Mahalanobis distance has exceeded the threshold value.

Inventors:

NAKADA SATORU (JP)
ABOSHI MINORU (JP)
YAMASHIRO SATOSHI (JP)
HASEGAWA HARUYUKI (JP)
MIZUNO KEN (JP)

Application Number:

PCT/JP2016/083180

Publication Date:

June 22, 2017

Filing Date:

November 09, 2016

Export Citation:

Click for automatic bibliography generation Help

Assignee:

MITSUBISHI ELECTRIC CORP (JP)

International Classes:

G05B23/02

Foreign References:

JP2011238147A	2011-11-24
JP2009009300A	2009-01-15
JP2015172945A	2015-10-01
JP2002099319A	2002-04-05
JP2014241329A	2014-12-25