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Title:
FAILURE PREDICTIVE DIAGNOSTIC SYSTEM AND FAILURE PREDICTIVE DIAGNOSTIC METHOD FOR DOOR SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/228723
Kind Code:
A1
Abstract:
With a view to enabling failure predictive diagnosis for drive units of individual doors and for an overall door system including a management unit, a communication device, and the like, this failure predictive diagnostic system for a door system, which has a management unit for giving instructions regarding opening/closing timings to a plurality of opening/closing devices that control opening and closing of individual doors, comprises: a data input unit through which information pertaining to the opening/closing time for each of the doors is inputted; a memory unit in which information pertaining to the opening/closing time for each of the doors including past information is stored; and a failure predictive diagnostic unit which determines, through a comparison of the information pertaining to the opening/closing time with the information including the past information pertaining to the opening/closing time, that there exists failure prediction in an opening/closing device of a part of the doors in the case where the opening/closing time of the part of the doors differs from the past opening/closing time, and determines that there exists failure prediction in the management unit in the case where the opening/closing time of all the doors differ from the past opening/closing time.

Inventors:
KITAI SASUGA (JP)
MIYAUCHI TSUTOMU (JP)
KOIKE JUN (JP)
Application Number:
PCT/JP2023/017428
Publication Date:
November 30, 2023
Filing Date:
May 09, 2023
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
B61B1/02; B61L23/00; E05F15/632; E05F15/70
Foreign References:
JP2021066232A2021-04-30
JP2020100325A2020-07-02
JP2019182252A2019-10-24
JP2016148963A2016-08-18
KR20210054868A2021-05-14
CN110816553A2020-02-21
Attorney, Agent or Firm:
DAI-ICHI INTERNATIONAL PATENT OFFICE, P.C. (JP)
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