Title:
FAILURE RISK ASSESSMENT SYSTEM AND FAILURE RISK ASSESSMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/166156
Kind Code:
A1
Abstract:
A failure risk assessment system equipped with: a history acquisition unit for acquiring the failure history of an overall system comprising a plurality of sub-systems and the maintenance history of one or more sub-systems selected from among the plurality of sub-systems; and a failure risk assessment model calculation unit which obtains the failure risk of a sub-system for which there is no maintenance history by calculating a failure risk assessment model for assessing the failure risk of said sub-system on the basis of the failure history of the overall system and the acquired maintenance history of the one or more sub-systems.
Inventors:
WATANABE AYUMI (JP)
HORI YOSHINARI (JP)
FUJIHIRA KENJI (JP)
IIZUKA HIDEHIRO (JP)
HORI YOSHINARI (JP)
FUJIHIRA KENJI (JP)
IIZUKA HIDEHIRO (JP)
Application Number:
PCT/JP2019/045076
Publication Date:
August 20, 2020
Filing Date:
November 18, 2019
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G06Q10/00
Foreign References:
| JP2006202171A | 2006-08-03 | |||
| JP2007316718A | 2007-12-06 | |||
| JP2009251822A | 2009-10-29 |
Attorney, Agent or Firm:
SHIN-YU INTERNATIONAL PATENT FIRM (JP)
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