Title:
FAILURE SOURCE DIAGNOSIS SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2011/104760
Kind Code:
A1
Abstract:
Condition-based preventative maintenance, in which a plurality of sensors are disposed in a device, the operating condition of the device is constantly monitored, the current condition of the device is assessed as normal or abnormal through comparison with the sensor data during normal operation of the device, and maintenance is performed in accordance with diagnostic results, is expanding. With condition-based preventative maintenance, it is possible to discover malfunctions that could not be discovered through periodical maintenance, since it is possible to rapidly detect age-related deterioration in the device. However, while it is possible to assess between normal and abnormal with existing diagnostic techniques, there has been difficulty specifying the source of failures, including abnormal phenomena and components. In cases in which a device to be diagnosed is assessed as deviating from the normal condition, the degree of deviation from parameters is calculated as an abnormality contribution degree using the normal condition as a basis, and the source of the failure is estimated from the degree of similarity between the abnormality contribution degree and the abnormality contribution degree of each failure source collected in the past, including phenomena of failure and failed components.
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Inventors:
UCHIYAMA, Hiroki (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
内山宏樹 (〒92 茨城県日立市大みか町七丁目１番１号 株式会社 日立製作所 日立研究所内 Ibaraki, 〒3191292, JP)
YUDA, Shinya (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
湯田晋也 (〒92 茨城県日立市大みか町七丁目１番１号 株式会社 日立製作所 日立研究所内 Ibaraki, 〒3191292, JP)
内山宏樹 (〒92 茨城県日立市大みか町七丁目１番１号 株式会社 日立製作所 日立研究所内 Ibaraki, 〒3191292, JP)
YUDA, Shinya (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
湯田晋也 (〒92 茨城県日立市大みか町七丁目１番１号 株式会社 日立製作所 日立研究所内 Ibaraki, 〒3191292, JP)
Application Number:
JP2010/001303
Publication Date:
September 01, 2011
Filing Date:
February 26, 2010
Export Citation:
Assignee:
HITACHI, LTD. (6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo, 80, 〒1008280, JP)
株式会社 日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
UCHIYAMA, Hiroki (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
内山宏樹 (〒92 茨城県日立市大みか町七丁目１番１号 株式会社 日立製作所 日立研究所内 Ibaraki, 〒3191292, JP)
YUDA, Shinya (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
株式会社 日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
UCHIYAMA, Hiroki (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
内山宏樹 (〒92 茨城県日立市大みか町七丁目１番１号 株式会社 日立製作所 日立研究所内 Ibaraki, 〒3191292, JP)
YUDA, Shinya (C/O Hitachi Research Laboratory, HitachiLtd., 1-1, Omika-cho 7-chome, Hitachi-sh, Ibaraki 92, 〒3191292, JP)
International Classes:
G05B23/02
Attorney, Agent or Firm:
INOUE, Manabu (C/O HITACHILTD, 6-1, Marunouchi 1-chome, Chiyoda-k, Tokyo 20, 〒1008220, JP)
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Claims: