Title:
FAULT DIAGNOSIS CIRCUIT AND FAULT DIAGNOSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2017/006603
Kind Code:
A1
Abstract:
Provided is a fault diagnosis circuit for diagnosing an open-circuit fault in a reverse connection protection transistor, the fault diagnosis circuit being provided with: a power feed part including a switching transistor placed in an on state or an off state in response to a control signal applied to a control terminal, the switching transistor being electrically connected to each of a power source and a reverse connection protection transistor, and electrical power being fed from the power source to the reverse connection protection transistor when the switching transistor is in the on state; a power feed control part for outputting a control signal to the switching transistor and thereby controlling power feeding and stopping of power feeding to the reverse connection protection transistor; and a diagnosis part for diagnosing an open-circuit fault in the reverse connection protection transistor on the basis of the output state of the control signal and the result of detecting a voltage between the switching transistor and the reverse connection protection transistor.
Inventors:
MIYAZAKI SHINICHI (JP)
SUZUKI TATSUYA (JP)
SUZUKI TATSUYA (JP)
Application Number:
PCT/JP2016/061246
Publication Date:
January 12, 2017
Filing Date:
April 06, 2016
Export Citation:
Assignee:
TOKAI RIKA CO LTD (JP)
International Classes:
G01R31/02; H02H7/00; H02P7/00
Foreign References:
| JP2015047035A | 2015-03-12 | |||
| JP2012188101A | 2012-10-04 | |||
| JP2015105605A | 2015-06-08 | |||
| JP2012242330A | 2012-12-10 | |||
| JP2015171305A | 2015-09-28 |
Other References:
See also references of EP 3293531A4
Attorney, Agent or Firm:
KAMEYA, Yoshiaki et al. (JP)
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