Title:
FAULT IMAGE GENERATION METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/222519
Kind Code:
A1
Abstract:
A fault image generation method and apparatus. The fault image generation method comprises: acquiring a non-fault image and a first fault image, wherein the non-fault image records a first object, in which no fault occurs, the first fault image records a second object, in which a fault occurs, and the type of the first object is different from that of the second object; and migrating a fault pattern of the second object in the first fault image onto the first object in the non-fault image, so as to obtain a second fault image, wherein the second fault image presents the first object in a fault state. A partial image of a certain type of object is replaced with a fault pattern, which records another type of object, so as to obtain a second fault image of the certain type of object, thereby improving the universality and the flexibility of acquiring the fault pattern, and increasing the diversity of fault types in the second fault image.
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Inventors:
DU CHANGDE (CN)
JIN XIN (CN)
JIANG HUAJIE (CN)
TU DANDAN (CN)
JIN XIN (CN)
JIANG HUAJIE (CN)
TU DANDAN (CN)
Application Number:
PCT/CN2021/139429
Publication Date:
October 27, 2022
Filing Date:
December 18, 2021
Export Citation:
Assignee:
HUAWEI CLOUD COMPUTING TECH CO LTD (CN)
International Classes:
G06T7/00
Foreign References:
| CN110909669A | 2020-03-24 | |||
| CN102216085A | 2011-10-12 | |||
| CN111091546A | 2020-05-01 | |||
| US20120050377A1 | 2012-03-01 |
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