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Patent Searching and Data


Title:
FEATURE EXTRACTION DEVICE, FEATURE EXTRACTION METHOD, COMPARISON SYSTEM, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2019/163699
Kind Code:
A1
Abstract:
Provided are a feature extraction device, a feature extraction method, and the like, with which inaccurate determination of a feature can be reduced even when a foreground region has not been extracted correctly. The feature extraction device comprises: a reliability determination unit that determines a degree of reliability with respect to a second region, which is a region that has been extracted as a foreground region of an image and is within a first region that has been extracted from the image as a partial region containing a recognition subject, said degree of reliability indicating the likelihood of being the recognition subject; a feature determination unit that, on the basis of the degree of reliability, uses a first feature which is a feature extracted from the first region and a second feature which is a feature extracted from the second region to determine a feature of the recognition subject; and an output unit that outputs information indicating the determined feature of the recognition subject.

Inventors:
KAWAI Ryo (7-1 Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
Application Number:
JP2019/005798
Publication Date:
August 29, 2019
Filing Date:
February 18, 2019
Export Citation:
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Assignee:
NEC CORPORATION (7-1 Shiba 5-chome, Minato-ku Tokyo, 01, 〒1088001, JP)
International Classes:
G06T7/254
Foreign References:
JP2011095921A2011-05-12
JP2014048970A2014-03-17
JP2010281637A2010-12-16
Attorney, Agent or Firm:
SHIMOSAKA Naoki (7-1 Shiba 5-chome, Minato-k, Tokyo 01, 〒1088001, JP)
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