FEATURE EXTRACTION ELEMENT, FEATURE EXTRACTION SYSTEM, AND DETERMINATION APPARATUS

Title:

FEATURE EXTRACTION ELEMENT, FEATURE EXTRACTION SYSTEM, AND DETERMINATION APPARATUS

Document Type and Number:

WIPO Patent Application WO/2017/168665

Kind Code:

A1

Abstract:

A feature extraction element is provided with: a light receiving substrate on which a plurality of light receiving elements for photoelectrically converting received light are two-dimensionally arranged; and one or a plurality of other substrates stacked on the light receiving substrate. The other substrates have: a convolution processing unit that has a plurality of multiplication circuits provided so as to correspond to each light receiving element or each block constituted by a plurality of light receiving elements and that performs, using the plurality of multiplication circuits, a convolution computation on signals output from the plurality of light receiving elements; a pooling processing unit that samples, on the basis of a predetermined condition, a signal output from the convolution processing unit; and connection wiring for delivering the sampled signal to the plurality of multiplication circuits.

Inventors:

MATSUMOTO SHIGERU (JP)
NAKANISHI SOTA (JP)
ISHIDA TOMOHISA (JP)
MIYAMOTO ATSUSHI (JP)
UCHIKAWA KIYOSHI (JP)

Application Number:

PCT/JP2016/060574

Publication Date:

October 05, 2017

Filing Date:

March 30, 2016

Export Citation:

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Assignee:

NIKON CORP (JP)

International Classes:

H04N5/3745; H04N5/345; H04N5/369

Foreign References:

JP2000333083A	2000-11-30
JP2005346472A	2005-12-15
JP2016033806A	2016-03-10
JP2003023573A	2003-01-24

Other References: