Title:
FEATURE POINT RECOGNITION SYSTEM AND RECOGNITION METHOD
Document Type and Number:
WIPO Patent Application WO/2020/218513
Kind Code:
A1
Abstract:
This feature point recognition system (1) compares data for a first group of feature points that a first algorithm computation unit (12) finds by non-masking processing and data for a second group of feature points that a third algorithm computation unit (16) detects via masking processing by a second algorithm computation unit (14), determines whether there are abnormalities in the data, and can thereby recognize the feature points of a subject P more accurately and stably than past systems.
Inventors:
TOKUYAMA KOUTAROU (JP)
MURANAMI HIROAKI (JP)
YAMASHITA TOMOKI (JP)
TOKUMOTO MASARU (JP)
UMINO TATSUYA (JP)
MURANAMI HIROAKI (JP)
YAMASHITA TOMOKI (JP)
TOKUMOTO MASARU (JP)
UMINO TATSUYA (JP)
Application Number:
JP2020/017697
Publication Date:
October 29, 2020
Filing Date:
April 24, 2020
Export Citation:
Assignee:
MAEKAWA SEISAKUSHO KK (JP)
International Classes:
G01N23/04; A22C17/00; A22C21/00; G06T7/00
Domestic Patent References:
| WO2012056793A1 | 2012-05-03 | |||
| WO2014064773A1 | 2014-05-01 |
Foreign References:
| US20180293721A1 | 2018-10-11 | |||
| JP2019053626A | 2019-04-04 | |||
| JP2018530739A | 2018-10-18 | |||
| JP2020103284A | 2020-07-09 | |||
| JP2019135624A | 2019-08-15 | |||
| JP2020042754A | 2020-03-19 |
Attorney, Agent or Firm:
TAZAKI Akira et al. (JP)
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