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Patent Searching and Data


Title:
FERROELECTRIC FIELD EFFECT TRANSISTOR, FERROELECTRIC RANDOM-ACCESS MEMORY, AND MANUFACTURING METHOD
Document Type and Number:
WIPO Patent Application WO/2023/220962
Kind Code:
A1
Abstract:
The present application provides a ferroelectric field effect transistor, a ferroelectric random-access memory, and a manufacturing method. The ferroelectric field effect transistor comprises a silicon-based substrate, a semiconductor layer, a ferroelectric layer, and a metal gate; the semiconductor layer is provided between the silicon-based substrate and the ferroelectric layer; the material of the silicon-based substrate is different from that of the semiconductor layer; and the semiconductor layer can moderate the difference in lattice parameters and thermal expansion coefficients of the silicon-based substrate and the ferroelectric layer, such that the ferroelectric field effect transistor can achieve higher retention performance.

Inventors:
LI XIUYAN (CN)
ZHONG SHUMAN (CN)
LIU CHUANCHUAN (CN)
MA CHAO (CN)
QIN QING (CN)
ZHOU XUE (CN)
JIAO HUIFANG (CN)
Application Number:
PCT/CN2022/093530
Publication Date:
November 23, 2023
Filing Date:
May 18, 2022
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
H01L29/78
Foreign References:
CN114447223A2022-05-06
CN110277410A2019-09-24
CN113745327A2021-12-03
CN108091693A2018-05-29
JP2012004304A2012-01-05
Attorney, Agent or Firm:
LONGSUN LEAD IP LTD. (CN)
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