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Title:
FIELD-EFFECT SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
Document Type and Number:
WIPO Patent Application WO/2014/185086
Kind Code:
A1
Abstract:
A field-effect semiconductor device having a Ge channel and a SiGe source/drain region. The field-effect semiconductor device is provided with a semiconductor layer (10), a gate insulating film (20), a gate electrode (31), a source/drain region (60), a Ge layer (63), and a wiring layer (72). The semiconductor layer (10) includes Ge. The gate electrode (31) is provided on the semiconductor layer (10) with the gate insulating film (20) interposed therebetween. The source/drain region (60) is provided on the semiconductor layer (10) on either side of the channel region under the gate electrode (31), and comprises Sii-xGex (0

Inventors:
KAMIMUTA YUUICHI (JP)
MORIYAMA YOSHIHIKO (JP)
Application Number:
PCT/JP2014/051222
Publication Date:
November 20, 2014
Filing Date:
January 22, 2014
Export Citation:
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Assignee:
NAT INST OF ADVANCED IND SCIEN (JP)
International Classes:
H01L21/336; H01L21/28; H01L21/768; H01L23/522; H01L29/417; H01L29/78
Domestic Patent References:
WO2012087404A12012-06-28
Foreign References:
JP2012501093A2012-01-12
JP2007214481A2007-08-23
Attorney, Agent or Firm:
KURATA, Masatoshi et al. (JP)
Masatoshi Kurata (JP)
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