Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
FILM LAYER STRUCTURE AND TEST METHOD, DISPLAY SUBSTRATE AND TEST METHOD AND PREPARATION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/173184
Kind Code:
A1
Abstract:
A film layer structure comprises: a first metal layer (1), a second metal layer (2) and an insulation layer (5) therebetween. In at least one part of an edge region of the film layer structure, the first metal layer (1) protrudes outwards by a first pre-determined length relative to an edge of the insulation layer (5), and the insulation layer (5) protrudes outwards by a second pre-determined length relative to an edge of the second metal layer (2). When the film layer structure is tested, a movement difference value of a probe between a surface of an insulation layer (5), adjacent to the second metal layer (2), and a surface of the first metal layer (1), adjacent to the insulation layer (5), is tested by testing an ascending or descending movement track of the probe, the thickness of the insulation layer (5) is obtained, and then according to a capacitance value and a relative area between the first and the second metal layers, a dielectric constant of the insulation layer (5) may be obtained by way of calculation.

Inventors:
ZHANG YUJUN (CN)
LIU CHAO (CN)
Application Number:
PCT/CN2015/089944
Publication Date:
November 03, 2016
Filing Date:
September 18, 2015
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
International Classes:
G01R27/26; G02F1/13
Foreign References:
CN104808072A2015-07-29
CN1841733A2006-10-04
CN102420209A2012-04-18
CN103053221A2013-04-17
US20130277650A12013-10-24
CN103026169A2013-04-03
CN104061853A2014-09-24
Attorney, Agent or Firm:
CHINA SCIENCE PATENT & TRADEMARK AGENT LTD. (CN)
中科专利商标代理有限责任公司 (CN)
Download PDF: