FILM MAPPING SYSTEM

WIPO Patent Application WO2005017489

A3

A materials properties measuring system for using electromagnetic radiation interactions with selected materials positioned at a measuring location to determine selected properties thereof having an electromagnetic radiation source along with a plurality of radiation convergence elements for receiving any incident beams of electromagnetic radiation including the source having corresponding selected cross sections substantially perpendicular to the input path, and for converging these incident beams into corresponding departing beams including to the selected material each having a selected cross section substantially perpendicular to the output path that is smaller than that of its corresponding incident beam, and transmitting them to a beamsplitter that has an area as great as any such element. An electromagnetic radiation receiver is provided to receive any beams of electromagnetic radiation incident thereon after propagating thereto from the beamsplitter. The electromagnetic radiation source for providing propagating selected electromagnetic radiation at an output thereof is formed by a plurality of electromagnetic radiation emitters with differing center emission wavelengths and a beam combiner is provided with them wherein any electromagnetic radiation emitted by any of said electromagnetic radiation emitters enters at differing points to follow at least in part a common optical path to an output through at least some portion of the combiner determined by reflections and transmissions thereof in and at the combiner.

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CHOW PETER P (US)

PCT/US2004/022144

December 15, 2005

July 12, 2004

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SVT ASSOCIATES INC (US)
CHOW PETER P (US)

G01B11/06; G01B11/08; G01B11/28; G01J3/00; G01J3/18; G01N21/84; G01N; (IPC1-7): G01J3/00; G01J3/18; G01B11/28; G01B11/08

US5475221A	1995-12-12
US5822060A	1998-10-13
US4264205A	1981-04-28
US5020909A	1991-06-04
US6654132B1	2003-11-25

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