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Patent Searching and Data


Title:
FILM SUBSTRATE AND METHOD FOR TESTING FILM SUBSTRATE
Document Type and Number:
WIPO Patent Application WO/2012/173075
Kind Code:
A1
Abstract:
Provided are: an image-capturing step (S101) for capturing a shaded image (30) on a surface of a rectangular film substrate; and an image-processing step (S102) in which a boundary is designated as a predetermined shading threshold and the shaded image (30) is divided into a first region (41), which is a region equal to or greater than the threshold, and a second region (42), which is a region less than the threshold (S102). Further provided are: a boundary-extracting step (S103) for extracting a boundary between the first region (41), which is positioned on an edge of the film substrate, and the second region (42), which is adjacent to the inside, in a predetermined region on the shaded image (40) after the image-processing step; a demarcation step (S104) in which the extracted boundaries are connected, thereby demarcating a film region (52); and a position-detecting step (S105) for detecting a position of the film region (52) inside the film substrate based on the distance between an edge of the film region (52) and the edge of the film substrate, on the shaded image (40).

Inventors:
SHOHJI ATSUSHI
Application Number:
PCT/JP2012/064876
Publication Date:
December 20, 2012
Filing Date:
June 11, 2012
Export Citation:
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Assignee:
SHARP KK (JP)
SHOHJI ATSUSHI
International Classes:
H05B33/12; H01L51/50; H05B33/10
Foreign References:
JP2000090267A2000-03-31
JP2006216425A2006-08-17
JP2001284047A2001-10-12
JP2006021104A2006-01-26
JP2010114339A2010-05-20
JP2010114338A2010-05-20
Attorney, Agent or Firm:
Fukami Patent Office, p. c. (JP)
Patent business corporation Fukami patent firm (JP)
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Claims: