Title:
FINE PARTICLE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/181803
Kind Code:
A1
Abstract:
A fine particle measurement device comprises: a support stand (20) that has a groove (F) extending in a prescribed direction and that, by accommodating in the groove (F) an elongated observation container (10) having, accommodated therein, a liquid sample including fine particles, supports the observation container (10) such that the groove (F) extension direction coincides with the longitudinal direction of the observation container (10); and an imaging unit (40) for imaging the fine particles inside the observation container (10) supported by the support stand (20) at a position at which the support stand does not enter into the field of view.
Inventors:
KIMURA AKINORI (JP)
MOTOMURA ASAKO (JP)
SUGIYAMA YOKO (JP)
SUGANUMA HIROSHI (JP)
MOTOMURA ASAKO (JP)
SUGIYAMA YOKO (JP)
SUGANUMA HIROSHI (JP)
Application Number:
PCT/JP2019/010936
Publication Date:
September 26, 2019
Filing Date:
March 15, 2019
Export Citation:
Assignee:
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
G01N15/14; G01N21/01
Domestic Patent References:
| WO2018221430A1 | 2018-12-06 |
Foreign References:
| JP2013255437A | 2013-12-26 | |||
| US6184990B1 | 2001-02-06 | |||
| JPH1073528A | 1998-03-17 | |||
| JP2009183469A | 2009-08-20 | |||
| JP2017044939A | 2017-03-02 | |||
| JP2009537826A | 2009-10-29 | |||
| JP2001221736A | 2001-08-17 | |||
| JPH0735679A | 1995-02-07 | |||
| JP2018052953A | 2018-04-05 | |||
| JP2014517263A | 2014-07-17 | |||
| JP2004532405A | 2004-10-21 |
Other References:
See also references of EP 3770580A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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