Title:
FLASH MEMORY SELF-TEST METHOD, SOLID HARD DISK AND STORAGE DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/073691
Kind Code:
A1
Abstract:
A flash memory self-test method, a solid hard disk, and a storage device.On this basis, the present invention can trigger a flash memory to perform a self-test according to the working state of the flash memory, can adaptively adjust the self-test, detect and eliminate retention errors in advance, and meet the performance index of a host for performing read and write operations on the flash memory while avoiding retention errors in the flash memory.
Inventors:
ZHANG JIXING (CN)
Application Number:
PCT/CN2019/093313
Publication Date:
April 16, 2020
Filing Date:
June 27, 2019
Export Citation:
Assignee:
SHENZHEN DAPU MICROELECTRONICS CO LTD (CN)
International Classes:
G11C29/12
Foreign References:
| CN109545267A | 2019-03-29 | |||
| CN102036277A | 2011-04-27 | |||
| CN101661799A | 2010-03-03 | |||
| US20030159095A1 | 2003-08-21 |
Attorney, Agent or Firm:
SHENPAT INTELLECTUAL PROPERTY AGENCY (CN)
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