Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
FLOW MEASUREMENT STRUCTURE AND FLOW MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/014632
Kind Code:
A1
Abstract:
The disclosed flow measurement structure (10) used in a flow measurement device (1) is provided with a conduit (20) through which flows the gas to be measured, and a diverter (21) which diverts gas flowing through the conduit (20) and conducts the diverted gas to a detection element (12) for measuring the flow amount of said gas. An inlet (31) of the diverter (21) is provided in the periphery of the conduit (20). The conduit (20) is provided with an inclined section (50) which, provided upstream of the inlet (31), guides the gas towards the center of the conduit (20).

Inventors:
UEDA NAOTSUGU
YAMAMOTO KATSUYUKI
NOZOE SATOSHI
MAEDA SHUJI
TSUKUMA YUJI
Application Number:
PCT/JP2011/065291
Publication Date:
February 02, 2012
Filing Date:
July 04, 2011
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
UEDA NAOTSUGU
YAMAMOTO KATSUYUKI
NOZOE SATOSHI
MAEDA SHUJI
TSUKUMA YUJI
International Classes:
G01F1/00; G01F1/684; G01F1/692
Domestic Patent References:
WO2005005932A12005-01-20
Foreign References:
JP2006078487A2006-03-23
JPS5860228U1983-04-23
JP2009287982A2009-12-10
JP2003176740A2003-06-27
JPS58105013A1983-06-22
JP2003523506A2003-08-05
JPH11166720A1999-06-22
JP2006329927A2006-12-07
JP2006308518A2006-11-09
JP2010060287A2010-03-18
Other References:
See also references of EP 2600115A4
Attorney, Agent or Firm:
MASUI, Yoshihisa et al. (JP)
Yoshihisa Masui (JP)
Download PDF:
Claims: