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Patent Searching and Data


Title:
FLUID PATH INSPECTION DEVICE AND FLUID PATH INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/042760
Kind Code:
A1
Abstract:
Provided are a fluid path inspection device and fluid path inspection method capable of simply carrying out categorization, analysis, and the like, of abnormality modes indicating, for example, whether a problem is a system problem, a leak in a dedicated tube, or a clamping pressure problem. The fluid path inspection device is provided with an abnormality emulation unit 21b that has proportional solenoid valves for pressure adjustment (V1a2, V1a4, V1a6, V1b2, V1b4, V1b6) and is for emulating, through fluid pressurization by a pressurization means under measurement 303 and fluid pressure adjustment by the proportional solenoid valves for pressure adjustment, fluid circuit characteristics exhibited by a plurality of abnormality modes that can occur in a fluid path of a device under measurement 3 and inspecting abnormalities in the fluid path of the device under measurement 3.

Inventors:
YOSHIOKA JUN (JP)
SASAKI TAKUJI (JP)
KOGAWA JUN (JP)
FUJITA MASAKI (JP)
AKAHIRA TOSHIKI (JP)
Application Number:
PCT/JP2015/004705
Publication Date:
March 24, 2016
Filing Date:
September 15, 2015
Export Citation:
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Assignee:
TAKASHIN CO LTD (JP)
International Classes:
G01M3/26; G01M99/00
Foreign References:
JP3192429B22001-07-30
JPH03158732A1991-07-08
JP4049412B22008-02-20
JP2005002915A2005-01-06
JP2014161737A2014-09-08
Other References:
See also references of EP 3163280A4
Attorney, Agent or Firm:
SUZUKI, SOHBE (JP)
Sobei Suzuki (JP)
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