Title:
FLUORESCENT X-RAY ANALYZER
Document Type and Number:
WIPO Patent Application WO/2021/235037
Kind Code:
A1
Abstract:
A total analysis time indicating means provided in a scanning fluorescent X-ray analyzer according to the present invention measures, for each kind of a sample to be analyzed, a reference sample for which the content of each component is known as a reference value, to obtain measured intensity for each measurement line corresponding to each component. The total analysis time indicating means further uses, for each component, a reference value and measured intensity to calculate the counting time for obtaining a designated analysis accuracy, and calculates a total counting time as the total of counting times for the components. The total analysis time indicating means calculates a total analysis time as the sum of the total counting time and a total non-counting time, and outputs the calculated total analysis time and the calculated counting time for each component.
Inventors:
KATAOKA YOSHIYUKI (JP)
NAGOSHI YASUHIKO (JP)
NAGOSHI YASUHIKO (JP)
Application Number:
PCT/JP2021/006935
Publication Date:
November 25, 2021
Filing Date:
February 24, 2021
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/223
Foreign References:
| JP6601854B1 | 2019-11-06 | |||
| JP2000065765A | 2000-03-03 | |||
| JP2012007928A | 2012-01-12 | |||
| JP2010078592A | 2010-04-08 | |||
| JP2000074857A | 2000-03-14 | |||
| JP2005098906A | 2005-04-14 |
Other References:
See also references of EP 4036563A4
Attorney, Agent or Firm:
SUGIMOTO, Shuji et al. (JP)
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