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Patent Searching and Data


Title:
FLYING-TYPE INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2017/065102
Kind Code:
A1
Abstract:
Provided is a flying-type inspection device that can use a small unmanned aircraft to perform inspection while controlling angle and distance with respect to a planar inspection target. Also provided is an inspection method. The present invention uses a flying-type inspection device 1 that comprises: a small unmanned aircraft 91 that has a plurality of rotor blades 911 and a control unit; an inspection unit 30 that is installed on the small unmanned aircraft 91 and that inspects the state of a target surface in a non-contact manner; and a measurement unit 20 that measures target distances, which are distances to the target surface, in a plurality of directions. The control unit comprises an estimation means that, on the basis of the target distances measured by the measurement unit 20, estimates confrontation parameters that comprise the angle of the inspection unit 30 with respect to the target surface and the distance thereof from the target surface at said angle. On the basis of the estimation results, the flying-type inspection device 1 moves the small unmanned aircraft 91 along the target surface and uses the inspection unit 30 to inspect various sites on the target surface while maintaining constant confrontation parameters for the inspection unit 30 with respect to the target surface.

Inventors:
ICHIHARA KAZUO (JP)
Application Number:
JP2016/079910
Publication Date:
April 20, 2017
Filing Date:
October 07, 2016
Export Citation:
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Assignee:
PRODRONE CO LTD (JP)
International Classes:
G01N21/84; B64C13/20; B64C27/08; B64C29/00; B64C39/02; B64D47/08; G01S17/88; G05D1/10
Foreign References:
US20140168420A12014-06-19
JP2005289127A2005-10-20
JP2003026097A2003-01-29
JP2015037937A2015-02-26
US20120262708A12012-10-18
US20140277842A12014-09-18
US20110160950A12011-06-30
Attorney, Agent or Firm:
WENO & PARTNERS (JP)
Patent business corporation Ueno patent firm (JP)
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