Title:
FOCUS EVALUATING METHOD, AND FOCUS EVALUATING DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/004004
Kind Code:
A1
Abstract:
N (where N is an integer at least equal to 2) sets of image data are each obtained by imaging a subject at mutually different distances by means of the same imaging device, which has a gradation degree for each pixel. This focus evaluating method includes a first step, a second step, a third step, and a fourth step, wherein, in the first step, M (where M is an integer at least equal to 2) types of classified data indicating a first region and a second region determined by classification employing M gradation degree thresholds, which are common to the N sets of image data, are obtained for each set of image data. In step 2, the size of the second region sandwiched between a pair of the first regions is obtained on the basis of each set of classified data. In step 3, N characteristic values are determined on the basis of the M sizes, for each set of image data. In step 4, the relative quality of the focus between the sets of image data is evaluated by comparing the characteristic values with one another.
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Inventors:
MORISHITA SAYAKA (JP)
YAMADA EIJI (JP)
YAMADA EIJI (JP)
Application Number:
PCT/JP2020/047557
Publication Date:
January 06, 2022
Filing Date:
December 18, 2020
Export Citation:
Assignee:
NIDEC CORP (JP)
International Classes:
H04N5/232; G02B7/28; G02B7/36; G06T7/80
Foreign References:
| JP2009109682A | 2009-05-21 | |||
| JP2002303780A | 2002-10-18 |
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