Title:
FOOD QUALITY INSPECTION DEVICE AND METHOD OF INSPECTING FOOD QUALITY
Document Type and Number:
WIPO Patent Application WO/2011/122584
Kind Code:
A1
Abstract:
Provided are a food quality inspection device and a method of inspecting food quality which are capable of inspecting food quality with high accuracy. A first near-infrared light with a first wavelength which is selected from absorption spectra specific to a substance to be measured and a second near-infrared light with a second wavelength which is absorbed less than the first near-infrared light by the substance to be measured are irradiated onto a food. The change in the first near-infrared light caused by the substance to be measured is detected on the basis of the difference between the first near-infrared light and the second near-infrared light in reflected light from the food, and the quality of the food is inspected.
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Inventors:
TAMURA MAMORU (JP)
Application Number:
PCT/JP2011/057707
Publication Date:
October 06, 2011
Filing Date:
March 28, 2011
Export Citation:
Assignee:
SYSTEM BRAIN CO LTD (JP)
TAMURA MAMORU (JP)
TAMURA MAMORU (JP)
International Classes:
G01N21/35
Domestic Patent References:
| WO2007046280A1 | 2007-04-26 |
Foreign References:
| JP4567814B1 | 2010-10-20 | |||
| JP2006177923A | 2006-07-06 | |||
| JP2006085688A | 2006-03-30 | |||
| JPH02290534A | 1990-11-30 | |||
| JPH11266792A | 1999-10-05 | |||
| JPH05180774A | 1993-07-23 | |||
| JPH0894517A | 1996-04-12 | |||
| JP2004301690A | 2004-10-28 |
Attorney, Agent or Firm:
KURIHARA, Hiroyuki et al. (JP)
Hiroyuki Kurihara (JP)
Hiroyuki Kurihara (JP)
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Claims: