Title:
FOREIGN MATERIAL INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/057735
Kind Code:
A1
Abstract:
This foreign material inspection device is provided with: a transfer unit that transfers a subject to be inspected; an X-ray inspection unit that detects, using X-ray transmissivity, a foreign material contained in the subject being transferred by means of the transfer unit; a metal detection unit, which is communicably connected to the X-ray inspection unit, and which can be operated independently from the X-ray inspection unit, said metal detection unit detecting, using interactions between a magnetic field and a metal, the foreign material contained in the subject being transferred by means of the transfer unit; a housing that houses inside at least a part of the transfer unit, the X-ray inspection unit, and the metal detection unit; a first display unit, which is provided to the housing, and which displays the operation screens of the X-ray inspection unit and the metal detection unit by being controlled by the X-ray inspection unit; and a second display unit, which is provided to the housing, and which displays the operation screen of the metal detection unit by being controlled by the metal detection unit.
Inventors:
TANAKA RYO (JP)
INOUE YUTA (JP)
INOUE YUTA (JP)
Application Number:
PCT/JP2016/079135
Publication Date:
April 06, 2017
Filing Date:
September 30, 2016
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
NISSIN ELECTRONICS CO LTD (JP)
NISSIN ELECTRONICS CO LTD (JP)
International Classes:
G01N23/04; G01N23/18; G01N27/72
Domestic Patent References:
| WO2005043149A1 | 2005-05-12 |
Foreign References:
| JP2015028465A | 2015-02-12 | |||
| JP2015028464A | 2015-02-12 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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