Title:
FOREIGN-MATTER INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/057737
Kind Code:
A1
Abstract:
This foreign-matter inspection device comprises: a transporting unit that transports an object to be inspected; an X-ray inspection unit that, by utilizing the permeability of X-rays, detects foreign matters included in the object to be inspected being transported by the transporting unit; a metal detection unit that, by utilizing interaction between a magnetic field and metal, detects foreign matters included in the object to be inspected being transported by the transporting unit; and a housing that houses therein the X-ray inspection unit, the metal detection unit, and at least a portion of the transporting unit, and that keeps the X-rays of the X-ray inspection unit from leaking outside. The housing is provided with a door part for opening and closing the housing. In a closed state, the door part abuts against the housing with an insulating body therebetween.
Inventors:
YAEGASHI TAKUYA (JP)
TANAKA TAKAYUKI (JP)
TANAKA TAKAYUKI (JP)
Application Number:
PCT/JP2016/079137
Publication Date:
April 06, 2017
Filing Date:
September 30, 2016
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
NISSIN ELECTRONICS CO LTD (JP)
NISSIN ELECTRONICS CO LTD (JP)
International Classes:
G01N23/04; G01N23/18; G01N27/72
Domestic Patent References:
| WO2005043149A1 | 2005-05-12 |
Foreign References:
| JP2015028465A | 2015-02-12 | |||
| JP2015028464A | 2015-02-12 | |||
| JPH0949883A | 1997-02-18 |
Other References:
See also references of EP 3358340A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Download PDF:
Previous Patent: EXHAUST GAS PURIFICATION CATALYST AND METHOD FOR PRODUCTION THEREOF
Next Patent: FOREIGN-MATTER INSPECTION DEVICE
Next Patent: FOREIGN-MATTER INSPECTION DEVICE