Title:
FOREIGN MATTER INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/217499
Kind Code:
A1
Abstract:
This foreign matter inspection device is provided with: a conveying unit (10) which conveys an article to be inspected; an X-ray inspection unit (2) which detects, by utilizing the transmissivity of X-rays, foreign matter contained in the article to be inspected that is being conveyed by the conveying unit; a metal detection unit (3) which detects, as foreign matter, a metal contained in the article to be inspected that is being conveyed by the conveying unit, by utilizing the interaction between the magnetic field and the metal; and a housing (4) which internally houses the metal detection unit, the X-ray inspection unit, and at least a part of the conveying unit, and which has an inlet (4a) for conveying the article to be inspected by the conveying unit and an outlet (4b) for conveying the article to be inspected by the conveying unit. The conveying unit includes: a first feed roller (13) provided at the upstream end of a conveyance region in which the article to be inspected is conveyed by the conveying unit; a second feed roller (14) provided at the downstream end of the conveyance region; an endless belt (15) suspended over the first feed roller and the second feed roller; a support plate (16) which is formed of a non-magnetic material and which supports the endless belt in the conveyance region; and an X-ray shield plate (100) which shields X-rays at either the inlet or the outlet, whichever among them close to the X-ray inspection unit.
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Inventors:
KAWAGUCHI YUJI (JP)
Application Number:
PCT/JP2017/022168
Publication Date:
December 21, 2017
Filing Date:
June 15, 2017
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
NISSIN ELECTRONICS CO LTD (JP)
NISSIN ELECTRONICS CO LTD (JP)
International Classes:
G01N23/18; G01N23/04; G01N27/72
Domestic Patent References:
| WO2005043149A1 | 2005-05-12 |
Foreign References:
| JP2015028465A | 2015-02-12 | |||
| JP2008268035A | 2008-11-06 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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