Title:
FOURIER TRANSFORM INFRARED SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2014/132379
Kind Code:
A1
Abstract:
Provided is a Fourier transform infrared spectrometer of high measurement accuracy, unaffected by changes in interference conditions arising from installation of an accessory part. This Fourier transform infrared spectrometer is a Fourier transform infrared spectrometer furnished on a base having an interference optical system shared with a specimen chamber (2) within which an accessory part (20) may be detachably installed, and is characterized by being provided with: an accessory part information reading means (22) for reading accessory part information from an accessory part (20) during installation of the accessory part (20) within the specimen chamber (2); and a setting parameter modifying means (controller (30)) for modifying the setting parameters of the interference optical system, which vary according to differences in the weight of each accessory part (20) and the like, doing so on the basis of the accessory part information read by the accessory part information reading means (22).
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Inventors:
FUKUDA HISATO (JP)
Application Number:
PCT/JP2013/055295
Publication Date:
September 04, 2014
Filing Date:
February 28, 2013
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01J3/45
Domestic Patent References:
| WO2012056776A1 | 2012-05-03 |
Foreign References:
| JP2005241551A | 2005-09-08 | |||
| JPH0587634A | 1993-04-06 | |||
| JPH02253103A | 1990-10-11 |
Other References:
See also references of EP 2963400A4
Attorney, Agent or Firm:
Kyoto International Patent Law Office (JP)
Patent business corporation Kyoto international patent firm (JP)
Patent business corporation Kyoto international patent firm (JP)
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